Accredited Standards Committee * X3, Information Technology
NEWS RELEASE
Doc. No.: PR/96-018
Reply to: Lynn Barra at lbarra@itic.nw.dc.us
X3 Announces the Public Comment Period for
ISO/IEC 11694-3:1995, Identification cards - Linear recording method
Part 3: Optical properties and characteristics
* To be adopted as an American National Standard *
Washington D.C., February 1996 - Accredited Standards Committee
X3, Information Technology is announcing the public comment period for
the adoption of ISO/IEC 11694-3:1995 as an American National Standard.
The public review extends from March 15, 1996 to May 14, 1996.
This part of 11694 defines the optical properties and characteristics of
optical memory cards using the linear recording method.
Submit all comments to: X3 Secretariat, Attn.: Lynn Barra, 1250 Eye
Street, NW, Suite 200, Washington, DC 20005, Email: lbarra@itic.nw.dc.us.
Send a copy to: ANSI, Attn.: BSR Center, 11 West 42nd St., New York, NY 10036.
A call for possible patents and pertinent issues (copyrights, trademarks) is
also being issued. Please submit information on these issues to the X3
Secretariat at 1250 Eye Street NW, Suite 200, Washington DC 20005.
Email: x3sec@itic.nw.dc.us
This standard can be purchased from ANSI, 11 West 42nd St., New York, NY
10036. (212) 642-4900.
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