ISO/IEC JTC 1/SC 17 Documents - 2008

Doc. No. Description
JTC1/SC17 N 3628

Notification of Ballot: ISO/IEC CD 10373-6.2 - Identification cards - Test methods - Part 6: Proximity cards

JTC1/SC17 N 3627

Disposition of comments: CD ISO/IEC 10373-6 – Identification Cards – Test methods – Part 6: Proximity cards

JTC1/SC17 N 3621

Notification of Ballot: ISO/IEC 10373-6:2001/FPDAM 7 – Identification Cards – Test methods – Part 6: Proximity cards – Amendment 7: Test methods for ePassport

JTC1/SC17 N 3620 Resolution of Comments: CD ISO/IEC 10373-6:2001/PDAM7 – Identification Cards – Test methods – Part 6: Proximity cards – Amendment 7: Test methods for ePassport
JTC1/SC17 N 3608

Resolution of ballot comments for FDIS 7811-6

JTC1/SC17 N 3587

Report of the Convenor of WG1 to the 21st Plenary Meeting of ISO/IEC JTC1/SC17 being held in London, UK, 2008-10-07/09

JTC1/SC17 N 3460 Ballot Result for ISO/IEC CD 24789-2 Identification cards - Card Service life - Part 2: Methods of evaluation (WG1 N 1799) (comments from France, Germany, Japan, and U.S.)
JTC1/SC17 N 3459 Ballot Result for ISO/IEC CD 24789-1 Identification cards - Card Service life - Part 1: Application profiles (WG1 N 1798) (comments from France, Germany, Japan, and U.S., with  additional German comments and supplementary annex information)

JTC1/SC17 N 3521

Calling Notice and draft agenda for the ISO/IEC JTC1/SC 17 WG 1 Meeting, Gunnersbury, England, 6 though 8 October 6-8, 2008

JTC1/SC17 N 3512 Revised List of Hotels for the October 2008 SC17 Plenary
JTC1/SC17 N 3505 Information from ISO Central Secretariat: New ISO eServices applications
JTC1/SC17 N 3502 Text for Ballot on ISO/IEC CD 10373-6 (Revision) - Identification cards - Test methods - Part 6: Proximity cards
JTC1/SC17 N 3493

First draft agenda for the 21st Plenary Meeting of ISO/IEC JTC1/SC17 being held in London, United Kingdom 2008-10-08/10

JTC1/SC17 N 3492 Calling notice for 21st SC17 plenary meetings 2008-10 in London, Great Britain - registration form, hotels, underground, and directions to BSI (revised hotel list)
JTC1/SC17 N 3474

Notification of Ballot: ISO/IEC CD 24789-2 - Identification cards - Card service life - Part 2: Methods of evaluation

JTC1/SC17 N 3473 Notification of Ballot: ISO/IEC CD 24789-1 - Identification cards - Card service life - Part 1: Application profiles.
JTC1/SC17 N 3367 Notification of Ballot: ISO Systematic Review of ISO/IEC 7816-5:2004 and ISO/IEC 7811-1:2002
JTC1/SC17 N 3366 Ballot result for ISO/IEC 7810 FPDAM 1 Identification Cards - Physical characteristics Amendment 1: Criteria for cards containing ICs

ISO/IEC JTC 1/SC 17/WG 1 Policy Documents - 2008

Doc. No. Description
1PD0003 WG1 policy on new reference material sources
1PD0002 WG1 Requirements for Reference Material cards
1PD0001

WG1 policy on test methods standards development

ISO/IEC JTC 1/SC 17/WG 1 Document Register - 2008

Doc. No. Description
WG1 N 1840

Disposition of Comments on CD 24789-1-2 2008-10 (2nd update of new WD 24789-1 and 2nd update of new WD 24789-2)

WG1 N 1839 Live WG1 Actions at 2008-12-01
WG1 N 1838

Datacard Test Proposal for T-H Exposure Followed by Peel

WG1 N 1837 Overdue actions to provide information for 24789
WG1 N 1836 Transfer times for thermal cycle profile
WG1 N 1835 CSL sequence building examples v2
WG1 N 1834 Report of the Convenor of WG1 to the 21st Plenary Meeting of ISO/IEC JTC1/SC17 being held in London, UK, 2008-10-07/09
WG1 N 1833 aka B10.3 05-002  Xavier test results
WG1 N 1832

Identification cards — Physical characteristics — Part 8: Magnetic stripe— Coercivity of 51,7 kA/m (650 Oe) AMENDMENT 1: Secondary reference card supplier

WG1 N 1831

Identification cards — Physical characteristics — Part 2: Magnetic stripe — Low coercivity AMENDMENT 1: Secondary reference card supplier

WG1 N 1830

ISO/IEC 7810/AM2: 2008(E) Identification cards — Physical characteristics AMENDMENT 2: Opacity, ID-1 size card

WG1 N 1829 ISO/IEC WD 7810 Identification cards — Physical characteristics
WG1 N 1828

Resolution of ballot comments for FDIS 7811-6

WG1 N 1827 Draft minutes from October WG1 meeting in Gunnersbury, England
WG1 N 1826 Japan comment on Harrisburg minutes (WG1 N 1815)
WG1 N 1825 Japan comment on WG9 response to WG1 comments on 11693-2 (WG1 N 1806)
WG1 N 1824 Summary of U.S. flexure data (WG1 N 1791)
WG1 N 1823 French Contribution on colour deviation measurement
WG1 N 1822 Fench Contribution on ESD conductivity
WG1 N 1821 French Contribution on ISO/IEC 24789-1
WG1 N 1820

Definition and illustration of axes in the Dynamic Bending Stress test in ISO/IEC 10373-1

WG1 N 1819 WG1 Agenda for 2008-10, London
WG1 N 1818 U. S. National Body position for October 2008 WG1 meeting in London, England
WG1 N 1817 Calling notice for October 2008 WG1 meeting in London, England
WG1 N 1816 ESD conductivity test
WG1 N 1815 Draft minutes from June WG1 meeting in Harrisburg, Pennsylvania
WG1 N 1814 DoC7811-6
WG1 N 1813 WD7810
WG1 N 1812 German sequence Annex D2 for inclusion in CD 24789-1 (WG1 N 1798)
WG1 N 1811 German comments on WD7810 (WG1 N 1773)
WG1 N 1810 German comments on Japanese list of criteria for ID cards (WG1 N 1737R)
WG1 N 1809 French response to Ed DoC for WG1 N 1782 (WG1 N 1796)
WG1 N 1808 WD for draft amendment of 10373-1
WG1 N 1807 Draft WG1 agenda for June meeting in Harrisburg, Pennsylvania
WG1 N 1806 WG9 response to WG1 comments on 11693-2 (WG1 N 1740)
WG1 N 1805 Gemalto contribution on daylight exposure requirement in WD7810 (WG1 N 1773)
WG1 N 1804 Gemalto contribution on contactless ESD relevance in WD7810 (WG1 N 1773)
WG1 N 1803 Gemalto contribution on ID-000 dimension in WD7810 (WG1 N 1773)
WG1 N 1802 Gemalto proposal to change ISO chemicals in WD7810 (WG1 N 1773)
WG1 N 1801 Criteria and testing of physical characteristics for ICCs with contacts
WG1 N 1800 WG1 Document Register 1N1701-1N1800
WG1 N 1799 CD 24789-2 for ballot
WG1 N 1798 CD 24789-1 for ballot
WG1 N 1797 Ed DoC for WG1 N 1781 German comments on draft CD 24789-1 (WG1 N 1779) and CD 24789-2 (WG1 N 1780)
WG1 N 1796 Ed DoC for WG1 N 1782 French comments on draft CD 24789-1 (WG1 N 1779) and CD 24789-2 (WG1 N 1780)
WG1 N 1795 Ed DoC for WG1 N 1790 Japanese comments on draft CD 24789-2 (WG1 N 1780)
WG1 N 1794 Ed DoC for WG1 N 1790 Japanese comments on draft CD 24789-1 (WG1 N 1779)
WG1 N 1793 U. S. comments on draft CD 24789-2 (WG1 N 1780)
WG1 N 1792 U. S. comments on draft CD 24789-1 (WG1 N 1779)
WG1 N 1791 U. S. National Body position on two Card Service Life issues
WG1 N 1790 Japanese comments on draft CD 24789-1 (WG1 N 1779) and CD 24789-2 (WG1 N 1780)
WG1 N 1789 U. S. editorial comments on draft CD 24789-2 (WG1 N 1780)
WG1 N 1788 U. S. editorial comments on draft CD 24789-1 (WG1 N 1779)
WG1 N 1787 French profile examples for inclusion in CD 24789-1
WG1 N 1786 Calling notice for June WG1  meeting in Harrisburg, Pennsylvania
WG1 N 1785 U. S. comments on WD7810 (WG1 N 1773)
WG1 N 1784 Japanese comments on WG1 N 1780
WG1 N 1783 Japanese comments on WG1 N 1779
WG1 N 1782 French comments on WG1 N 1779 and WG1 N 1780
WG1 N 1781 German comments on WG1 N 1779 and WG1 N 1780
WG1 N 1780 CD 24789-2 2008-04
WG1 N 1779 CD 24789-1 2008-04
WG1 N 1778 Report on questions raised regarding 10373-2
WG1 N 1777 Revision of 1N1741 - Gene Meier and Brad Paulson Card Service Life Proposal
WG1 N 1776 Revision of 1N1751 draft WG1 policy on new reference material sources
WG1 N 1775 Resolution of ballot comments (JTC1/SC17 N 3366) for 7810 FPDAM
WG1 N 1774 Identification cards - Physical characteristics Amendment 1: Criteria for cards containing integrated circuits
WG1 N 1773 Updated WD 7810
WG1 N 1772 US static discharge test results
WG1 N 1771 QCard Letter of understanding - Reference card supply
WG1 N 1770 French Test cycle schematic for 24789-1
WG1 N 1769 French Guide to test selection table for 24789-1
WG1 N 1768 German Table of initial and final tests for 24789-1
WG1 N 1767 German Correlation of card service life tests
WG1 N 1766 Draft minutes from March TF2 meeting in Meudon, France
WG1 N 1765 Draft minutes from March WG1 meeting in Meudon, France
WG1 N 1764 Japan Comment on Card Service Life
WG1 N 1763 US draft for 24789-1 Card Service Life
WG1 N 1762 German comments on GM/BP card service life proposal (WG1 N 1741)
WG1 N 1761 DIN test marix for 24789-1
WG1 N 1760 Draft TF2 agenda for March meeting in Paris
WG1 N 1759 German comments on WD7810 (WG1 N 1732)
WG1 N 1758 French comments on US proposal (WG1 N 1741)
WG1 N 1757 French proposal for toxicity test for 7810 and 10373-1
WG1 N 1756 French proposal for light exposure test for 24789-2
WG1 N 1755 French 15457-3 friction coefficient measurement results for plastic cards
WG1 N 1754 US position for March TF2 meeting in Paris
WG1 N 1753 US proposal for linear dimensional change test for 24789-2
WG1 N 1752 US comments on WD24789-2 (WG1 N 1683)
WG1 N 1751 Draft WG1 policy on new reference material sources
WG1 N 1750 French supporting information for new 15457-1 and -3
WG1 N 1749 Draft requirements for parts 2 and 6 of 7811
WG1 N 1748 Draft WG1 agenda for March meeting in Paris
WG1 N 1747 US national body positon for March WG1 meeting in Paris
WG1 N 1746 WD for draft amendment of 10373-1
WG1 N 1745 Calling notice for WG1 and WG1/TF2 meetings 2008-03
WG1 N 1744 Gene Meier flexure proposal for WD 24789-2
WG1 N 1743 France response to Card Service Life Proposal
WG1 N 1742 France contribution on ratio of chip and magnetic stripe cards
WG1 N 1741 Gene Meier and Brad Paulson Card Service Life Proposal

ISO/IEC JTC 1/SC 17/WG 8 Document Register - 2008

Doc. No. Description
WG8 N 1358 ISO/IEC FDIS 10373-7 Identification cards - Test methods - Part 7: Vicinity cards