ISO/IEC JTC 1/SC 17 Documents - 2008 |
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| Doc. No. | Description |
| JTC1/SC17 N 3608 |
Resolution of ballot comments for FDIS 7811-6 |
| JTC1/SC17 N 3587 |
Report of the Convenor of WG1 to the 21st Plenary Meeting of ISO/IEC JTC1/SC17 being held in London, UK, 2008-10-07/09 |
| JTC1/SC17 N 3460 | Ballot Result for ISO/IEC CD 24789-2 Identification cards - Card Service life - Part 2: Methods of evaluation (WG1 N 1799) (comments from France, Germany, Japan, and U.S.) |
| JTC1/SC17 N 3459 | Ballot Result for ISO/IEC CD 24789-1 Identification cards - Card Service life - Part 1: Application profiles (WG1 N 1798) (comments from France, Germany, Japan, and U.S., with additional German comments and supplementary annex information) |
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Calling Notice and draft agenda for the ISO/IEC JTC1/SC 17 WG 1 Meeting, Gunnersbury, England, 6 though 8 October 6-8, 2008 |
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| JTC1/SC17 N 3512 | Revised List of Hotels for the October 2008 SC17 Plenary |
| JTC1/SC17 N 3505 | Information from ISO Central Secretariat: New ISO eServices applications |
| JTC1/SC17 N 3502 | Text for Ballot on ISO/IEC CD 10373-6 (Revision) - Identification cards - Test methods - Part 6: Proximity cards |
| JTC1/SC17 N 3493 |
First draft agenda for the 21st Plenary Meeting of ISO/IEC JTC1/SC17 being held in London, United Kingdom 2008-10-08/10 |
| JTC1/SC17 N 3492 | Calling notice for 21st SC17 plenary meetings 2008-10 in London, Great Britain - registration form, hotels, underground, and directions to BSI (revised hotel list) |
| JTC1/SC17 N 3474 |
Notification of Ballot: ISO/IEC CD 24789-2 - Identification cards - Card service life - Part 2: Methods of evaluation |
| JTC1/SC17 N 3473 | Notification of Ballot: ISO/IEC CD 24789-1 - Identification cards - Card service life - Part 1: Application profiles. |
| JTC1/SC17 N 3367 | Notification of Ballot: ISO Systematic Review of ISO/IEC 7816-5:2004 and ISO/IEC 7811-1:2002 |
| JTC1/SC17 N 3366 | Ballot result for ISO/IEC 7810 FPDAM 1 Identification Cards - Physical characteristics Amendment 1: Criteria for cards containing ICs |
ISO/IEC JTC 1/SC 17/WG 1 Policy Documents - 2008 |
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| Doc. No. | Description |
| 1PD0003 | WG1 policy on new reference material sources |
| 1PD0002 | WG1 Requirements for Reference Material cards |
| 1PD0001 |
WG1 policy on test methods standards development |
ISO/IEC JTC 1/SC 17/WG 1 Document Register - 2008 |
|
| Doc. No. | Description |
| WG1 N 1836 | Transfer times for thermal cycle profile |
| WG1 N 1835 | CSL sequence building examples v2 |
| WG1 N 1834 | Report of the Convenor of WG1 to the 21st Plenary Meeting of ISO/IEC JTC1/SC17 being held in London, UK, 2008-10-07/09 |
| WG1 N 1833 | aka B10.3 05-002 Xavier test results |
| WG1 N 1832 |
Identification cards Physical characteristics Part 8: Magnetic stripe Coercivity of 51,7 kA/m (650 Oe) AMENDMENT 1: Secondary reference card supplier |
| WG1 N 1831 |
Identification cards Physical characteristics Part 2: Magnetic stripe Low coercivity AMENDMENT 1: Secondary reference card supplier |
| WG1 N 1830 |
ISO/IEC 7810/AM2: 2008(E) Identification cards Physical characteristics AMENDMENT 2: Opacity, ID-1 size card |
| WG1 N 1829 | ISO/IEC WD 7810 Identification cards Physical characteristics |
| WG1 N 1828 |
Resolution of ballot comments for FDIS 7811-6 |
| WG1 N 1827 | Draft minutes from October WG1 meeting in Gunnersbury, England |
| WG1 N 1826 | Japan comment on Harrisburg minutes (WG1 N 1815) |
| WG1 N 1825 | Japan comment on WG9 response to WG1 comments on 11693-2 (WG1 N 1806) |
| WG1 N 1824 | Summary of U.S. flexure data (WG1 N 1791) |
| WG1 N 1823 | French Contribution on colour deviation measurement |
| WG1 N 1822 | Fench Contribution on ESD conductivity |
| WG1 N 1821 | French Contribution on ISO/IEC 24789-1 |
| WG1 N 1820 |
Definition and illustration of axes in the Dynamic Bending Stress test in ISO/IEC 10373-1 |
| WG1 N 1819 | WG1 Agenda for 2008-10, London |
| WG1 N 1818 | U. S. National Body position for October 2008 WG1 meeting in London, England |
| WG1 N 1817 | Calling notice for October 2008 WG1 meeting in London, England |
| WG1 N 1816 | ESD conductivity test |
| WG1 N 1815 | Draft minutes from June WG1 meeting in Harrisburg, Pennsylvania |
| WG1 N 1814 | DoC7811-6 |
| WG1 N 1813 | WD7810 |
| WG1 N 1812 | German sequence Annex D2 for inclusion in CD 24789-1 (WG1 N 1798) |
| WG1 N 1811 | German comments on WD7810 (WG1 N 1773) |
| WG1 N 1810 | German comments on Japanese list of criteria for ID cards (WG1 N 1737R) |
| WG1 N 1809 | French response to Ed DoC for WG1 N 1782 (WG1 N 1796) |
| WG1 N 1808 | WD for draft amendment of 10373-1 |
| WG1 N 1807 | Draft WG1 agenda for June meeting in Harrisburg, Pennsylvania |
| WG1 N 1806 | WG9 response to WG1 comments on 11693-2 (WG1 N 1740) |
| WG1 N 1805 | Gemalto contribution on daylight exposure requirement in WD7810 (WG1 N 1773) |
| WG1 N 1804 | Gemalto contribution on contactless ESD relevance in WD7810 (WG1 N 1773) |
| WG1 N 1803 | Gemalto contribution on ID-000 dimension in WD7810 (WG1 N 1773) |
| WG1 N 1802 | Gemalto proposal to change ISO chemicals in WD7810 (WG1 N 1773) |
| WG1 N 1801 | Criteria and testing of physical characteristics for ICCs with contacts |
| WG1 N 1800 | WG1 Document Register 1N1701-1N1800 |
| WG1 N 1799 | CD 24789-2 for ballot |
| WG1 N 1798 | CD 24789-1 for ballot |
| WG1 N 1797 | Ed DoC for WG1 N 1781 German comments on draft CD 24789-1 (WG1 N 1779) and CD 24789-2 (WG1 N 1780) |
| WG1 N 1796 | Ed DoC for WG1 N 1782 French comments on draft CD 24789-1 (WG1 N 1779) and CD 24789-2 (WG1 N 1780) |
| WG1 N 1795 | Ed DoC for WG1 N 1790 Japanese comments on draft CD 24789-2 (WG1 N 1780) |
| WG1 N 1794 | Ed DoC for WG1 N 1790 Japanese comments on draft CD 24789-1 (WG1 N 1779) |
| WG1 N 1793 | U. S. comments on draft CD 24789-2 (WG1 N 1780) |
| WG1 N 1792 | U. S. comments on draft CD 24789-1 (WG1 N 1779) |
| WG1 N 1791 | U. S. National Body position on two Card Service Life issues |
| WG1 N 1790 | Japanese comments on draft CD 24789-1 (WG1 N 1779) and CD 24789-2 (WG1 N 1780) |
| WG1 N 1789 | U. S. editorial comments on draft CD 24789-2 (WG1 N 1780) |
| WG1 N 1788 | U. S. editorial comments on draft CD 24789-1 (WG1 N 1779) |
| WG1 N 1787 | French profile examples for inclusion in CD 24789-1 |
| WG1 N 1786 | Calling notice for June WG1 meeting in Harrisburg, Pennsylvania |
| WG1 N 1785 | U. S. comments on WD7810 (WG1 N 1773) |
| WG1 N 1784 | Japanese comments on WG1 N 1780 |
| WG1 N 1783 | Japanese comments on WG1 N 1779 |
| WG1 N 1782 | French comments on WG1 N 1779 and WG1 N 1780 |
| WG1 N 1781 | German comments on WG1 N 1779 and WG1 N 1780 |
| WG1 N 1780 | CD 24789-2 2008-04 |
| WG1 N 1779 | CD 24789-1 2008-04 |
| WG1 N 1778 | Report on questions raised regarding 10373-2 |
| WG1 N 1777 | Revision of 1N1741 - Gene Meier and Brad Paulson Card Service Life Proposal |
| WG1 N 1776 | Revision of 1N1751 draft WG1 policy on new reference material sources |
| WG1 N 1775 | Resolution of ballot comments (JTC1/SC17 N 3366) for 7810 FPDAM |
| WG1 N 1774 | Identification cards - Physical characteristics Amendment 1: Criteria for cards containing integrated circuits |
| WG1 N 1773 | Updated WD 7810 |
| WG1 N 1772 | US static discharge test results |
| WG1 N 1771 | QCard Letter of understanding - Reference card supply |
| WG1 N 1770 | French Test cycle schematic for 24789-1 |
| WG1 N 1769 | French Guide to test selection table for 24789-1 |
| WG1 N 1768 | German Table of initial and final tests for 24789-1 |
| WG1 N 1767 | German Correlation of card service life tests |
| WG1 N 1766 | Draft minutes from March TF2 meeting in Meudon, France |
| WG1 N 1765 | Draft minutes from March WG1 meeting in Meudon, France |
| WG1 N 1764 | Japan Comment on Card Service Life |
| WG1 N 1763 | US draft for 24789-1 Card Service Life |
| WG1 N 1762 | German comments on GM/BP card service life proposal (WG1 N 1741) |
| WG1 N 1761 | DIN test marix for 24789-1 |
| WG1 N 1760 | Draft TF2 agenda for March meeting in Paris |
| WG1 N 1759 | German comments on WD7810 (WG1 N 1732) |
| WG1 N 1758 | French comments on US proposal (WG1 N 1741) |
| WG1 N 1757 | French proposal for toxicity test for 7810 and 10373-1 |
| WG1 N 1756 | French proposal for light exposure test for 24789-2 |
| WG1 N 1755 | French 15457-3 friction coefficient measurement results for plastic cards |
| WG1 N 1754 | US position for March TF2 meeting in Paris |
| WG1 N 1753 | US proposal for linear dimensional change test for 24789-2 |
| WG1 N 1752 | US comments on WD24789-2 (WG1 N 1683) |
| WG1 N 1751 | Draft WG1 policy on new reference material sources |
| WG1 N 1750 | French supporting information for new 15457-1 and -3 |
| WG1 N 1749 | Draft requirements for parts 2 and 6 of 7811 |
| WG1 N 1748 | Draft WG1 agenda for March meeting in Paris |
| WG1 N 1747 | US national body positon for March WG1 meeting in Paris |
| WG1 N 1746 | WD for draft amendment of 10373-1 |
| WG1 N 1745 | Calling notice for WG1 and WG1/TF2 meetings 2008-03 |
| WG1 N 1744 | Gene Meier flexure proposal for WD 24789-2 |
| WG1 N 1743 | France response to Card Service Life Proposal |
| WG1 N 1742 | France contribution on ratio of chip and magnetic stripe cards |
| WG1 N 1741 | Gene Meier and Brad Paulson Card Service Life Proposal |
ISO/IEC JTC 1/SC 17/WG 8 Document Register - 2008 |
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| Doc. No. | Description |
| WG8 N 1358 | ISO/IEC FDIS 10373-7 Identification cards - Test methods - Part 7: Vicinity cards |