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B10.3 CDTF
Document Register 2004 |
| Document
# |
Date
|
Contributor
|
Description |
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B10.3
cdtf 04 001
|
1-7-04
|
Gene
Meir
|
Round
Robin Testing List
|
b10.3_cdtf_04_002
|
1-7-04 |
Kevin
Tall
|
Eclipse
Labs Contribution to Winter 2004 meeting
|
| b10.3_cdtf_04_003 |
1-19-04
|
Kevin
Tall |
Post
Winter working paper
|
| b10.3_cdtf_04_004 |
1-29-04
|
Gene
Meir |
Winter
2004 minutes
|
| b10.3_cdtf_04_005 |
1-29-04 |
Gene
Meir |
ISO
8780-2 1990 Paint shaker
|
| b10.3_cdtf_04_006 |
1-29-04 |
Gene
Meir |
ASTM
D5420 1988 impact test
|
| b10.3_cdtf_04_007 |
2-23-04
|
Gene
Meir |
ISO
11126-8 Sandblast cleaning
|
| b10.3_cdtf_04_008 |
3-23-04
|
Gene
Meir |
Data
Card round robin test results
|
| b10.3_cdtf_04_009 |
6-1-04
|
Kevin
Tall |
Proposal
for mini card tests
|
| b10.3_cdtf_04_010 |
4-20-04
|
Gene
Meir |
Spring
2004 meeting agenda
|
| b10.3_cdtf_04_011 |
4-26-04
|
Brad
Paulson
|
Impact
test round robin
|
| b10.3_cdtf_04_012 |
4/27/04
|
Bill
Crawford
|
Waytek
Contribution
|
| b10.3_cdtf_04_013 |
4-28-04
|
John
Ko
|
3M
wet abrasion test results
|
| b10.3_cdtf_04_014 |
5-4-04
|
Kevin
Tall |
Post
Spring working paper |
| b10.3_cdtf_04_015 |
5-4-04 |
Gene
Meir |
Spring
2004 minutes |
| b10.3_cdtf_04_016 |
|
Brad
Paulson |
Case
Study of card durability
|
| b10.3_cdtf_04_017 |
7.28-04
|
Gene
Meir |
Summer
Meeting Agenda (Boston)
|
| b10.3_cdtf_04_018 |
8-16-04
|
Kevin
Tall |
Eclipse
Position-Boston
Linear dim change & card integrity test sequence
|
| b10.3_cdtf_04_019 |
8-24-04
|
Kevin
Tall |
Post
Boson Meeting update of working paper |
| b10.3_cdtf_04_020 |
8-24-04
|
Gene
Meir |
Minutes
of August Boston Meeting |
| b10.3_cdtf_04_021 |
8-24-04
|
Bill
Crawford |
Round
robin test data dimensional change at elevated temperature |
| b10.3_cdtf_04_022 |
8-27-04
|
Functional
Materials |
Compositional
analysis of French Plasticized PVC Film |
| b10.3_cdtf_04_023 |
8-27-04
|
Functional
Material |
Round robin test data delamination |
| b10.3_cdtf_04_024 |
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| b10.3_cdtf_04_025 |
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| b10.3_cdtf_04_026 |
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| b10.3_cdtf_04_027 |
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