B10.3 CDTF Document Register 2004
Document # Date
Contributor
Description

B10.3 cdtf 04 001

1-7-04
Gene Meir
Round Robin Testing List
b10.3_cdtf_04_002
1-7-04 Kevin Tall
Eclipse Labs Contribution to Winter 2004 meeting
b10.3_cdtf_04_003 1-19-04
Kevin Tall Post Winter working paper
b10.3_cdtf_04_004 1-29-04
Gene Meir Winter 2004 minutes
b10.3_cdtf_04_005 1-29-04 Gene Meir ISO 8780-2 1990 Paint shaker
b10.3_cdtf_04_006 1-29-04 Gene Meir ASTM D5420 1988 impact test
b10.3_cdtf_04_007 2-23-04
Gene Meir ISO  11126-8 Sandblast cleaning
b10.3_cdtf_04_008 3-23-04
Gene Meir Data Card round robin test results
b10.3_cdtf_04_009 6-1-04
Kevin Tall Proposal for mini card tests
b10.3_cdtf_04_010 4-20-04
Gene Meir Spring 2004 meeting  agenda
b10.3_cdtf_04_011 4-26-04
Brad Paulson
Impact test round robin
b10.3_cdtf_04_012 4/27/04
Bill Crawford
Waytek Contribution
b10.3_cdtf_04_013 4-28-04
John Ko
3M wet abrasion test results
b10.3_cdtf_04_014 5-4-04
Kevin Tall Post Spring working paper
b10.3_cdtf_04_015 5-4-04 Gene Meir Spring 2004 minutes
b10.3_cdtf_04_016
Brad Paulson Case Study of card durability
b10.3_cdtf_04_017 7.28-04
Gene Meir Summer Meeting Agenda (Boston)
b10.3_cdtf_04_018 8-16-04
Kevin Tall Eclipse Position-Boston Linear dim change & card integrity test sequence
b10.3_cdtf_04_019  8-24-04 Kevin Tall Post Boson Meeting update of working paper
b10.3_cdtf_04_020  8-24-04 Gene Meir Minutes of August Boston Meeting
b10.3_cdtf_04_021  8-24-04 Bill Crawford Round robin test data dimensional change at elevated temperature
b10.3_cdtf_04_022  8-27-04 Functional Materials Compositional analysis of French Plasticized PVC Film
b10.3_cdtf_04_023 8-27-04 Functional Material Round robin test data delamination
b10.3_cdtf_04_024


b10.3_cdtf_04_025


b10.3_cdtf_04_026


b10.3_cdtf_04_027