| B10.3 CDTF Document Register 2006 | |||
| Doc. No. | Date | Source | Description |
| b10.3_cdtf_06_001 | 2006-01-03 | Gene Meier | Proposed Changes to Impact and Peel Testing |
| b10.3_cdtf_06_002 | 2006-01-26 | Bill Crawford | Bidirectional Flexer Development Update |
| b10.3_cdtf_06_003 | 2006-01-11 | Gene Meier | DINP-based Plasticizer Stress Round Robin |
| b10.3_cdtf_06_004 | 2006-01-11 | Brad Paulson | DINP-based Plasticizer Stress Precision and Bias |
| b10.3_cdtf_06_005 | 2006-01-12 | Eric Berner | Card Structure Integrity Proposal |
| b10.3_cdtf_06_006 | 2006-02-07 | Gene Meier | winter 2006 meeting minutes |
| b10.3_cdtf_06_007 | 2006-02-07 | Gene Meier | CDTF Contact & Attendance Information - post winter'06 |
| b10.3_cdtf_06_008 | 2006-02-14 | Kevin Tall | INCITS 322 Working Paper - post winter'06 |
| b10.3_cdtf_06_009 | 2006-04-21 | Gene Meier | Spring 2006 meeting announcement and agenda |
| b10.3_cdtf_06_010 | 2006-04-16 | 1N1530 | Identification cards - Card service life - Test methods |
| b10.3_cdtf_06_011 | 2006-04-21 | Kevin McCormick | Plasticized vinyl information |
| b10.3_cdtf_06_012 | 2006-04-25 | Jon Ko | Elevated T-H and Delamination Sequence |
| b10.3_cdtf_06_013 | 2006-05-03 | Bill Crawford | More Waytek Biflex Data |
| b10.3_cdtf_06_014 | 1992-08-15 | ISO 2409 - 1992 | Cross Hatch Tape Test "Permission is granted by ITI to members of INCITS, its technical committees, and their associated task groups to reproduce this document for the purposes of INCITS standardization activities without further permission, provided this notice is included. All other rights are reserved. Any commercial or for-profit reproduction is strictly prohibited" |
| b10.3_cdtf_06_015 | 2006-05-08 | Kevin Tall | BiFlex Test Data |
| b10.3_cdtf_06_016 | 2006-04-16 | 1N1530R | draft CD ISO-IEC_Card Service Life Test Methods |
| b10.3_cdtf_06_017 | 2006-05-09 | Gene Meier | U.S. Comments on 1N1530R2 |
| b10.3_cdtf_06_018 | 2006-05-09 | Gene Meier | spring 2006 meeting minutes |
| b10.3_cdtf_06_019 | 2006-05-09 | Gene Meier | CDTF Contact & Attendance Information - post spring'06 |
| b10.3_cdtf_06_020 | 2006-06-15 | Kevin Tall | INCITS 322 - reviewed |
| b10.3_cdtf_06_021 | 2006-07-20 | Gene Meier | WG1 TF2 Xenon Arc Calibration Testing |
| b10.3_cdtf_06_022 | 2006-07-19 | Gene Meier | Summer 2006 Meeting Agenda |
| b10.3_cdtf_06_023 | 2006-07-28 | Brad Paulson | repeatability and reproducibility study of mono and bi flex test methods |
| b10.3_cdtf_06_024 | 2006-08-14 | Gene Meier | CDTF Contact & Attendance Information - post summer 2006 |
| b10.3_cdtf_06_025 | 2006-09-05 | Kevin Tall | INCITS 322 - B10.3 Final for B10 Review |
| b10.3_cdtf_06_026 | 2006-08-16 | Gene Meier | Summer 2006 meeting minutes |
| b10.3_cdtf_06_027 | 2006-08-15 | Gene Meier | U.S. Comments on 1N1563 |