B10.3 Web Site

Welcome to
ANSI/INCITS B10.3 Task Group,
ID Card Durability and Service Life Standards

B10.3 General Information

On 1 December 2007, InterNational Committee for Information Technology Standards (INCITS) Task Groups B10.3 Card Durability and related Test Methods and B10.6 Physical Characteristics, Magnetic Stripes, and Test Methods were merged to form INCITS Task Group B10.11 Physical Characteristics. The INCITS B10.11 Task Group assumed responsibility for standardization in card durability and associated test methods.

B10.3 Mission Statement

Phase I
To identify card failure mechanisms and to simulate the mechanisms by accelerated test techniques.
Phase II
To determine a methodology that can predict the service life of a card construction.
Phase III
To create a card durability/performance report, guideline or requirement for a range of card applications.

B10.3 Card Durability and Service Life Task Group is the U.S. TAG to ISO/IEC_JTC_1/SC17 ID Cards and personal identification, Working Group 1, Card Durability, Task Force 2 (WG1/TF2).

FAQ

B10.3, Task Group, whose Parent Group is INCITS B10, is organized as follows:

Work Description (Note 1)	B10 Sub Group	SC 17 Working Group
Card Service Life	B10.3 Task Group	WG1/TF2
Card Durability Test Methods Task Force (Note 2)	B10.3 CDTF Task Force	WG1/TF2 (Note 3)

Notes:
1.	Published standards can be obtained through ANSI.org_Purchase Standards or INCITS_Standards Store
2.	B10.3 formed Task Forces to define and clarify Card Application Profile, Card Failure Mechanisms, and Communications. B10.6 formed Task Forces for projects including Card Durability Test Methods Task Force (CDTF), which was responsible for ANSI INCITS 322 Card Durability Test Methods. In 2000, CDTF was transferred from B10.6 upon approval of the card durability/service life work proposal and initiation of B10.3. Card Application Profile, Card Failure Mechanisms, and Communications Task Forces completed the components for inclusion in the Card Durability/Service Life Working Document and were disbanded. CDTF was disbanded in August 2006 upon submission of the final committee draft of the third edition of ANSI INCITS 322.
3.	The B10.3 Card Durability Test Methods Task Force reports on card durability test method issues to B10.3 Task Group, who in turn approves and submits US positions on International durability test methods to SC17 WG1/TF2 or US ballot positions to B10 Plenary

B10.3 Officers

Chairman: Brad Paulson, Thor Engineering
Secretary: Gene Meier, DataCard
Project Editor: Julie Hermanson, Versatile Card Technology

B10.3 Honor Roll

Membership

Membership Directory (password required)

How to Join B10.3 :

Standards

ANSI INCITS (Final Committee Draft (FCD) Stage) - 322 Card Durability Test Methods *
ANSI INCITS (Final Committee Draft (FCD) Stage) - Card Durability / Card Service Life

ANSI INCITS (New Work Proposal (NWIP) Stage) - Stress and Evaluation Methods for Card Durability Characterization

Presently there are no International standards for Card Durability and Card Service Life. However ISO/IEC JTC1 SC17 has approved a New Work Proposal for such standards, which will be developed in Task Force 2 of Working Group 1 (WG1/TF2).

Published standards are available from ANSI.org_Standards_Store as downloads or from INCITS_Standards_Store

* Considerable amount of round robin testing has been done during the development of each test method. However, there were insufficient data to statistically determine precision and bias . B10.3 has established a single document that contains the data accumulated for each test method. These data are provided in the Round Robin Test Results Standing Document.

Annual Report

INCITS B10.3 does not publish a separate annual report, however, its activities are described in the INCITS_B10 Annual report which covers the period from May 2006 through May 2007.

Meetings

INCITS B10.3 Task Group generally meets three times per year, January, April/May and August. The B10.3 Meeting is generally scheduled to take place on the Tuesday prior to B10 Plenary meeting which normally is held on Thursday.

Meeting Calendar	2007	2008
Winter	16 January, Carson, California	28-29 January, Carson, California
Spring	30 April and 1 May, Minneapolis, Minnesota	April/May, Columbus, Ohio
Summer/Fall	20-21 August, Washington, D. C.	TBA

Venue details are posted below 2 to 3 months prior to the next meeting

B10.3 Documents

B10.3 Card Durability Task Force (Task Force)	B10.3 Card Service Life (Task Group)	SC17/WG1/TF2 (Task Force)
B10.3 Meeting Minutes
	B10.3 2007 Docs	WG1/TF2 2007 Docs
CDTF-2006 Docs	B10.3 2006 Docs
CDTF-2005 Docs	B10.3 2005 Docs
CDTF-2004 Docs	B10.3 2004 Docs
CDTF-2003 Docs	B10.3 2003 Docs
CDTF-2002 Docs	B10.3 2002 Docs
Documents are available directly from the index, some documents are password protected.

Next Meeting

When

Next meeting - 28 and 29 January 2008 at 8:00 am

Where

Location - The next B10 Plenary and subcommittee meetings will be held in Carson, California

The DoubleTree Hotel

Carson Civic Plaza

2 Civic Plaza Drive

Carson, California 90745

Telephone: +1 (310) 830 - 9200

www.carsondoubletree.com

Please call 1-800-222-TREE for reservations and ask for the MagTek 2008 group rate. You can also book on line at www.carsondoubletree.com or www.doubletree.com and the Group Code is MTK. Attendees should ask for the special negotiated rate of $119.00 per night.

Please be aware that the deadline to make reservations is December 20, 2007. Due to the holidays we request that you make your reservations promptly.

The sponsors for the meeting, Exponent, Giesecke & Devrient, HID Global and MagTek, will host a cocktail reception at the hotel on Wednesday evening, January 30, 2008.

Complete Venue

Meeting Notice

Venue Information

Meeting Agenda

Agenda - B10.11 cdtf 08-001

Web Page Information

The SC17 Standards document which describes all ID card standards, their relationships, and SC17 procedures for standards development is now available at the the ISO/IEC_JTC1 SC17 web site. This free downloadable document is especially valuable to anyone desiring information on ID Card International Standards.