B10.3 Web Site

B10.3 Mission Statement

Phase I
To identify card failure mechanisms and to simulate the mechanisms by accelerated test techniques.

Phase II
To determine a methodology that can predict the service life of a card construction.

Phase III
To create a card durability/performance report, guideline or requirement for a range of card applications.

FAQ

B10.3 Structure

B10.3 is organized as follows:

Work Description	B10 Sub Group	SC 17 Working Group
Card Service Life	B10.3 Task Group	WG1/TF2

Card Durability Test Methods Task Force (Note 1)	B10.3 CDTF Task Force	WG1/TF2 Note 2
Communications	B10.3 Breakout Group	None
Card Service Life Matrix	B10.3 Breakout Group	None
Xavier U. Data Analysis	B10.3 Breakout Group	None

Notes:
1.	B10.3 CDTF is rsponsible for development of ANSI INCITS 322:2002 Card Durability Test Methods
2.	The B10.3 Card Durability Test Methods Task Force reports on card durability test method issues to B10.3 Task Group, who in turn approves and submits US positions on International durability test methods to SC17 WG1/TF2 or US ballot positions to B10 Plenary

B10.3 Membership

B10.3 Officers
	B10.3	Card Durability Task Force	Breakouts
	B10.3	Card Durability Task Force	Communications	Xavier Data Analysis	Card Service Life
Chair	Open (see Note below)	Brad Paulson Plastag	Kevin B. Tall Eclipse Labs	Dick Jablonski Mag Tek	Dennis Cauley Assa Abloy ITG
Vice Chair	Felix Schvartsman
Secretary	Simon Shepherd DuPont Tejin Films	Gene Meier Data Card
Project Editor	Gene Meier Data Card	Kevin B. Tall Eclipse Labs

Note: Julie Hermanson of Plastag has resigned as Chair of B10.3 prior to the August 2004 meeting. Felx Schartsman has agreed to serve as chair until one is appointed.

How can I join B10.3

Membership Contact List

B10.3 Honor Roll

B10.3 Documents

B10.3 CDTF (Task Force)	B10.3 CSL (Task Group)
Meeting Minutes
CDTF 2004 Docs	B10.3 2004 Docs
CDTF 2003 Docs	B10.3 2003 Docs

B10.3 Standards

ANSI INCITS 322:2002 - Card Durability Test Methods (Published) *
ANSI INCITS (Working Paper (WP) Stage) - Card Durability / Card Service Life

Presently there are no International standards for Card Durability and Card Service Life. However ISO/IEC JTC1 SC17 WG1/TF2 is working on a New Work Proposal for such standards.

Published standards are available from INCITS Standards Store

* Considerable amount of round robin testig has been done during the development of each test method. However, there were insufficient data to statistically determine precision and bias . B10.3 has established a single docment that contains the data accumulated for each test method. These data are provided in the Round Robin Standing Document.

Annual Report

INCITS B10.3 does not publish a separate annual report, however, its activities are described in the INCITS B10 Annual report b10_04n3067 which covers the period from 2003-01-23 to 2004-01-20

Meetings

INCITS B10.3 Task Group generally meets three times per year, January, April/May and August. The B10.3 Meetings are generally scheduled to take place on the Monday and Tuesday prior to B10 Plenary meeting which normally is held on Thursday.

Next Meeting

When

B10.3 Card Durability Task Force	January 17, 2005 8:00 AM-Noon
B10.3 Card Service Life.	January 17, 2005 1:00PM to 5PM January 18, 2005 8:00AM to 5PM

Where

Marriott, West Palm Beach
1001 Okeechobee Blvd.
West Palm Beach, FL 33401
Tel 561 833 1234 Fax 561 833 1255

Co-Hosted by H.W.Sands Corp and CPI Card Group

Venue Information

Deadline for special rates is December 15, 2004

Meeting Notice

Venue Information

Meeting Agenda

TBA

B10.3 Officers